JPS6249562B2 - - Google Patents
Info
- Publication number
- JPS6249562B2 JPS6249562B2 JP51077190A JP7719076A JPS6249562B2 JP S6249562 B2 JPS6249562 B2 JP S6249562B2 JP 51077190 A JP51077190 A JP 51077190A JP 7719076 A JP7719076 A JP 7719076A JP S6249562 B2 JPS6249562 B2 JP S6249562B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- test film
- optical system
- signal
- film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7719076A JPS533363A (en) | 1976-06-30 | 1976-06-30 | Measurement method and measurement device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7719076A JPS533363A (en) | 1976-06-30 | 1976-06-30 | Measurement method and measurement device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS533363A JPS533363A (en) | 1978-01-13 |
JPS6249562B2 true JPS6249562B2 (en]) | 1987-10-20 |
Family
ID=13626886
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7719076A Granted JPS533363A (en) | 1976-06-30 | 1976-06-30 | Measurement method and measurement device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS533363A (en]) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE84221T1 (de) * | 1981-12-02 | 1986-08-14 | Advanced Semiconductor Products, Santa Cruz, Calif. | Duenne optische membranen, sowie methode und vorrichtung zu ihrer herstellung sowie messung von dicke und brechungsindex. |
JPS60127403A (ja) * | 1983-12-13 | 1985-07-08 | Anritsu Corp | 厚み測定装置 |
JPS6211106A (ja) * | 1985-03-01 | 1987-01-20 | Agency Of Ind Science & Technol | 干渉法膜厚測定装置 |
JPS61294338A (ja) * | 1985-06-21 | 1986-12-25 | Agency Of Ind Science & Technol | 干渉法膜屈折率測定装置 |
JP2510418B2 (ja) * | 1986-09-26 | 1996-06-26 | 工業技術院長 | ビ−ム走査型干渉法膜厚測定装置 |
JPS6453101A (en) * | 1987-05-25 | 1989-03-01 | Kurashiki Boseki Kk | Equal tilt angle interference type film thickness gauge |
JPH0810190B2 (ja) * | 1987-08-08 | 1996-01-31 | 三菱化学株式会社 | 薄膜の電気光学効果の測定方法 |
DE3890776T1 (de) * | 1987-09-18 | 1989-08-17 | Ricoh Kk | Verfahren und einrichtung zum messen von brechungsindex und dicke einer duennschicht |
JPS6475903A (en) * | 1987-09-18 | 1989-03-22 | Ricoh Kk | Method for measuring refractive index and film thickness |
US4999014A (en) * | 1989-05-04 | 1991-03-12 | Therma-Wave, Inc. | Method and apparatus for measuring thickness of thin films |
JPH062122U (ja) * | 1992-06-15 | 1994-01-14 | 横河電機株式会社 | 横ずらし干渉計 |
DE19520094A1 (de) * | 1995-06-01 | 1996-12-05 | Bayer Ag | Vorrichtung zur Messung der optischen Transmission und Dicke transparenter Materialien |
JP3631856B2 (ja) * | 1996-07-26 | 2005-03-23 | 大日本印刷株式会社 | 透明膜の検査方法 |
JP2013148509A (ja) * | 2012-01-20 | 2013-08-01 | Canon Inc | 画像処理装置及び画像処理方法 |
CN109632711B (zh) * | 2019-01-10 | 2021-10-01 | 山东拓步教育科技有限公司 | 一种ps小球层数检测装置 |
JP2021060342A (ja) * | 2019-10-09 | 2021-04-15 | パイオニア株式会社 | 検出装置 |
-
1976
- 1976-06-30 JP JP7719076A patent/JPS533363A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS533363A (en) | 1978-01-13 |
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